NT-MDT offers Atomic Force Microscopy, STM, SNOM & confocal Raman instruments and integrated systems for scientific and industrial applications.
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Atomic Force Microscopy for Nanotechnology & Scientific Research | NT-MDT | ntmdt.com Reviews
https://ntmdt.com
NT-MDT offers Atomic Force Microscopy, STM, SNOM & confocal Raman instruments and integrated systems for scientific and industrial applications.
ntmdt.com
Modular AFM STM system Solver Nano
http://www.ntmdt.com/practical-afm/atomic-force-microscope-solver-nano
AFM Probes online shop. AFM - Raman - SNOM. For Research and Education. Holds a strong positions in scientific research as is used as a routine analytical tool for physical properties characterization with high spatial resolution down to atomic level. Solver Nano is the best choice for scientists who are need a single instrument that is an affordable, robust, user-friendly and professional tool. Solver Nano - AFM for science. AFM techniques in compact SPM design. Configuration and experimental setup:.
Webinars. NT-MDT - AFM-probes, atomic force microscope (AFM, STM, SPM, RAMAN, SNOM)
http://www.ntmdt.com/webinars
AFM Probes online shop. AFM - Raman - SNOM.
Webinars. NT-MDT - AFM-probes, atomic force microscope (AFM, STM, SPM, RAMAN, SNOM)
http://www.ntmdt.com/webinars/archive
AFM Probes online shop. AFM - Raman - SNOM. Http:/ www.ntmdt.com/webinars/archive/2016. Http:/ www.ntmdt.com/webinars/archive/2015. Http:/ www.ntmdt.com/webinars/archive/2014. Http:/ www.ntmdt.com/webinars/archive/2013. Http:/ www.ntmdt.com/webinars/archive/2012. Dr Stanislav I. Leesment. Data Processing and Representation in Atomic Force Microscopy. The webinar took place on May 25, 2016. Image Analysis 3.5 download link. Compositional imaging of complex materials with atomic force microscopy.
Bio AFM LIFE. NT-MDT - AFM-probes, atomic force microscope (AFM, STM, SPM, RAMAN, SNOM)
http://www.ntmdt.com/bio-afm/life
AFM Probes online shop. AFM - Raman - SNOM. Fully automated AFM integrated. With Inverted Light Microscope. LIFE is Atomic Force Microscope with XYZ scanning measuring head compatible with inverted optical microscope with NA 0.55 condensers. It is used for biological and medical researches in physiological conditions. AFM and ILM integration. PX Pro controller allows closed loop operation with up to 6 scanning axes. Basic XYZ scanning is done by the probe and provided by decoupled flexure stage. ...The N...
Atomic Force Microscope NEXT | NT-MDT
http://www.ntmdt.com/device/solver-next
AFM Probes online shop. AFM - Raman - SNOM. Easy to use technology enabling. Multiple AFM/STM capabilities and. Delivering world class performance. Noise floor and thermal drifts. Scanner with XYZ low-noise close-loop. SPM modes in basic configuration. Zoom from millimeter to nanometer range. With new Atomic Force Microscopy technique HybriD Mode™. Cantilever recognition and automatic laser alignment both in liquid. Panoramic optical field of view up to 7×7mm with 2um resolution. Coupled with the PX Ultr...
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Archiwa: Analiza cząstek - Labnatek urządzenia badawcze i pomiarowe
http://labnatek.pl/urzadzenia/analiza
Spektroskopia XPS, ESCA. Wibracyjny dichroizm kołowy VCD. Analizator cząstek qNano wykorzystuje unikalną technikę TRPS (Tunable Resistive Pulse Sensing). Opartą na nanoporach. Umożliwia dokładny pomiar właściwości fizyczny wielu rodzajów cząstek. Detekcja oparta na nanoporach pozwala mierzyć oddzielnie tysiące cząstek, zapewniając znacznie większą szczegółowość i dokładność niż techniki oparte na świetle. Szybka, prosta i dokładna analiza komórek bazująca na technice TRPS (Tunable Resistive Pulse Sensing).
Archiwa: Mikroskopia TEM - Labnatek urządzenia badawcze i pomiarowe
http://labnatek.pl/urzadzenia/mikroskopiatem
Spektroskopia XPS, ESCA. Wibracyjny dichroizm kołowy VCD. Wyrażam zgodę na przetwarzanie moich danych osobowych przez firmę IGHT S.C. z siedzibą w Warszawie, ul. Marszałkowska 80, w celach marketingowych, zgodnie z Ustawą o Ochronie Danych Osobowych ( Dz. U. Nr 101/02, poz. 926). Marszałkowska 80, 00-517 Warszawa. Tel 48 22 119 47 17. Fax 48 22 258 47 31. Portal jest własnością firmy IGHT s.c.
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XXIV International Conference On Raman Spectroscopy. 10 - 15 August 2014. Conference sessions will be running from Monday morning to Friday afternoon. On Tuesday attendees can choose between several excursions. A conference dinner will take place on Wednesday. Keynote lectures will be given in the mornings. Friedrich Schiller University Jena. Access via Carl-Zeiss-Straße or Krautgasse). 07743 Jena, Germany. Submit your nominations for the Raman Awards. More information could be found here. The Tourist In...
Czwarte Sympozjum Naukowo Badawcze Izon - Labnatek urządzenia badawcze i pomiarowe
http://labnatek.pl/czwarte-sympozjum-naukowo-badawcze-izon
Spektroskopia XPS, ESCA. Wibracyjny dichroizm kołowy VCD. Czwarte Sympozjum Naukowo Badawcze Izon. Sierpień 7, 2015. Merton College, Oxford, UK on 10-11 Września 2015. Czwarte Sympozjum Naukowo Badawcze firmy Izon Science będzie skoncentrowane na postępie w badaniach związanych z użytkowaniem techniki TRPS. Drugi dzień wykładów poświęcony będzie rozwojowi badań nad mikropęcherzykami zewnątrzkomórkowymi i postępowi w normalizacji separacji i pomiaru EV. Marszałkowska 80, 00-517 Warszawa.
nanotextiles.human.cornell.edu
Textiles Nanotechnology
http://nanotextiles.human.cornell.edu/equipment.htm
We have a customized. Universal SPM system NTEGRA Prima - - NT-MDT. Equipped with the following special devices and accessories:. Flow Through Liquid Cell for online measurements of liquid-solid interactions with nanoscale resolution. Microscopy Module for assessing mechanical properties of conjugated fibers and polymeric nanodomains. Closed-Loop scanner for measuring mechanical properties of individual Nanofibers. High Temperature Sample Holder to assess thermally induced transitions. Our group extensiv...
Nano and Giga Solutions Inc.
http://nanoandgiga.com/board.html
Service for a better world. Scanning probe microscopy, nanotechnology instrumentation. Senior Consultant at SEMATECH. Process, materials and device design for advanced electronics. Professor of Arizona State University. Transport in semiconductor devices, computational electronics, quantum and nanostructured devices and device technology. President of Nano and Giga Solutions. Computational materials design and project management. President of Computational Chemistry List, LtD.
RUSNANOPRIZE | Laureates
http://www.forinnovations.org/en/laureates
Nomination: Energy efficiency and green technologies. Профессор Университета Поля Сабатье (Франция). За формулирование фундаментальных принципов и разработку углеродных наноматериалов для электрохимических суперконденсаторов, которые активно применяются в энергетике, автомобильной и других отраслях промышленности. Юрий Гогоци, Профессор Университета Дрекселя, директор института наноматериалов Университета Дрекселя (США). Maxwell Technologies Inc. (США). Nomination: Optics and nanoelectronics. Development...
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XXIV International Conference On Raman Spectroscopy. 10 - 15 August 2014. Conference sessions will be running from Monday morning to Friday afternoon. On Tuesday attendees can choose between several excursions. A conference dinner will take place on Wednesday. Keynote lectures will be given in the mornings. Friedrich Schiller University Jena. Access via Carl-Zeiss-Straße or Krautgasse). 07743 Jena, Germany. Submit your nominations for the Raman Awards. More information could be found here. The Tourist In...
Excursion
http://ispm2016.epfl.ch/index.php/venue
The 2016 ISPM conference will take place at the Sunstar Hotel Alpine Grindelwald. For more information on the region: Grindelwald Website.
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Неизвестный хост: www.ntmdt-development.com
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Неизвестный хост: www.ntmdt-europe.com
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Atomic Force Microscopy for Nanotechnology & Scientific Research | NT-MDT
AFM Probes online shop. Atomic Force Microscopes for Nanotechnology, Scientific Research and Education. AFM - Raman - SNOM. Versatile automated AFM-Raman, SNOM. Atomic Force Microscope for Research and Education. Ultimate resolution, quantitative analysis. Morphological, mechanical, chemical, electric, magnetic and. Other properties within a single scan. Compatible with: TITANIUM, NEXT, NTEGRA Prima,. NTEGRA Spectra, SPECTRUM and LIFE systems. TERS probes for nano-Raman imaging. APS March Meeting 2017.
Buy AFM probes, NT-MDT webshop (AFM, STM, SNOM/NSOM,SThM, tips , cantilevers, calibration gratings, HOPG, substrates, test samples, colloidal probes, accessories ). High accuracy Noncontact AFM ETALON probes. Prices.
AFM and nano-Spectroscopy Systems. Request a deconvo program. AFM probe ETALON series. AFM probes GOLDEN series. Super Sharp AFM probes. High aspect ratio AFM cantilevers. Diamond Coated Conductive Probes. HOPG, Substrates, Test Samples. 29032018, April 2018 special offer. 15032018, Upcoming events. 25012018, Webinar AFM integration with Laser Spectroscopy: Challenges, Solutions, Advantages. The webinar took place on Thu, Jan 18, 2018. Please find the webinar record and presentation following this link.
Atomic Force Microscopy for Nanotechnology & Scientific Research | NT-MDT
Atomic Force Microscopy for Nanotechnology, Scientific Research and Education. AFM - Raman - SNOM. Bull; Record breaking Raman enhancement factors. Bull; Nano-Raman spatial resolution: down 10nm. Bull; High speed TERS* mapping. Bull; Mass produced, based on serial AFM cantilevers. Bull; Complete commercial solution for TERS. Atomic Force Microscope for Research and Education. Ultimate resolution, quantitative analysis. Morphological, mechanical, chemical, electric, magnetic and. FHNW Muttenz (Switzerland...
Atomic Force Microscopy for Nanotechnology & Scientific Research | NT-MDT
Atomic Force Microscopy for Nanotechnology, Scientific Research and Education. AFM - Raman - SNOM. Bull; Record breaking Raman enhancement factors. Bull; Nano-Raman spatial resolution: down 10nm. Bull; High speed TERS* mapping. Bull; Mass produced, based on serial AFM cantilevers. Bull; Complete commercial solution for TERS. Atomic Force Microscope for Research and Education. Ultimate resolution, quantitative analysis. Morphological, mechanical, chemical, electric, magnetic and. FHNW Muttenz (Switzerland...
Atomic Force Microscopy for Nanotechnology & Scientific Research | NT-MDT
Atomic Force Microscopy for Nanotechnology, Scientific Research and Education. AFM - Raman - SNOM. Bull; Record breaking Raman enhancement factors. Bull; Nano-Raman spatial resolution: down 10nm. Bull; High speed TERS* mapping. Bull; Mass produced, based on serial AFM cantilevers. Bull; Complete commercial solution for TERS. Atomic Force Microscope for Research and Education. Ultimate resolution, quantitative analysis. Morphological, mechanical, chemical, electric, magnetic and. FHNW Muttenz (Switzerland...
NT-MDT S&L — NT-MDT S&L
NT-MDT Service and Logistics Ltd. The Irish office is involved in. Components for the parent. Choose from our high-quality. SPM probes, calibration. Gratings, HOPG, and test. Sample in our web-shop. To discuss your questions. With our online experts,. Use our unique Ask-online. SPM is now available. For MAC OS users. Get the first app for Nano. From the iTunes App Store.
Atomic Force Microscopy for Nanotechnology & Scientific Research | NT-MDT
Atomic Force Microscopy for Nanotechnology, Scientific Research and Education. AFM - Raman - SNOM. Bull; Record breaking Raman enhancement factors. Bull; Nano-Raman spatial resolution: down 10nm. Bull; High speed TERS* mapping. Bull; Mass produced, based on serial AFM cantilevers. Bull; Complete commercial solution for TERS. Atomic Force Microscope for Research and Education. Ultimate resolution, quantitative analysis. Morphological, mechanical, chemical, electric, magnetic and. FHNW Muttenz (Switzerland...
Atomic Force Microscopy for Nanotechnology & Scientific Research | NT-MDT
Atomic Force Microscopy for Nanotechnology, Scientific Research and Education. AFM - Raman - SNOM. Bull; Record breaking Raman enhancement factors. Bull; Nano-Raman spatial resolution: down 10nm. Bull; High speed TERS* mapping. Bull; Mass produced, based on serial AFM cantilevers. Bull; Complete commercial solution for TERS. Atomic Force Microscope for Research and Education. Ultimate resolution, quantitative analysis. Morphological, mechanical, chemical, electric, magnetic and. FHNW Muttenz (Switzerland...
Группа компаний НТ-МДТ – АСМ-зонды, Сканирующие зондовые микроскопы (АСМ, СТМ, СЗМ, СБОМ, Раман), высоковакуумное и сверхвысоковакуумное нанотехнологическое оборудование (Нанофаб)
Непревзойденное качество и количественный анализ. Морфологические, механические, химические, электрические. Магнитные и прочие свойства за один цикл сканирования. Совместимость с моделями: TITANIUM, NEXT,NTEGRA Prima,. NTEGRA Spectra, SPECTRUM и LIFE. НТ-МДТ в Америке. Выпуск новостей # 6, Июнь 2015. 7-8 мая НТ-МДТ проведет бесплатный семинар в университете г. Бат, Англия. CARBONHAGEN 2015 6th symposium on carbon and related nanomaterials. Август, 13-14, 2015. Международный авиакосмический салон МАКС-2015.
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