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Computer Systems & Reliable SOC LAB
http://soc.yonsei.ac.kr/
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—II: EXPRESS BRIEFS ...
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—II: EXPRESS BRIEFS, VOL. 51, NO. 11, NOVEMBER 2004 603 Code-Width Testing-Based Compact ADC BIST Circuit
http://soc.yonsei.ac.kr/Abstract/International_journal/pdf/Code-Width%20Testing%20Based%20Compact%20ADC%20BIST%20(Built-In%20Self-Test)%20Circuit.pdf
A New Wafer Level Latent Defect Screening namjh-ITC-Last[11]
paper 30.2 international test conference 1 1-4244-4203-0/08/$20.00 ©2008 ieee
http://soc.yonsei.ac.kr/Abstract/International_conference/pdf/A%20new%20wafer%20level%20latent%20defect%20screening%20methodology%20for%20highly%20reliable%20dram%20using%20a%20response%20surface%20method.pdf
8th Korea Test conference Tutorial Barua [호환 모드]
Challen g es In Testin g For gg A nalo g and Mixed Si g nal Cores of SOC Cores of SOC Dr. Alok Barua Research Professor, School of Electrical and Electronics ...
http://soc.yonsei.ac.kr/test/papers/8th/t-2.pdf
IT SoC Research Lab
[2011/03/02] [2011. 2] 정부는 System IC 분야를 국가전략산업으로 지정! [2011/03/02] [2011.1.2] 김재석 지도교수님 IEEE Circuit&System Society ...
http://it-soc.yonsei.ac.kr/main/main.php
延世大學校(YONSEI UNIVERSITY)
Kang, Sungho; Ph.D. (Univ. of Texas at Austin ), SOC design and testing. E-mail : shkang@yonsei.ac.kr. 02-2123-2775. homepage : http://soc.yonsei.ac.kr
http://chinese.yonsei.ac.kr/sinchon/engin_electronic_01.asp
Faults In Interconnection - Free Download (pdf,doc,xls,rtf,ppt,pps ...
A High-Level Signal Integrity Fault Model and Test Methodology for ... ... soc.yonsei.ac.kr/.../..fault..interconnections.pdf Download- Preview - Embed
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Dsp Algorithms And Architecture - Free Download (pdf,doc,xls,rtf ...
Search Result for: dsp algorithms and architecture: About 35 results ... soc.yonsei.ac.kr/.../..dsp architecture..algorithm.pdf Download- Preview - Embed
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ieee papers for embedded dram | Free Manual Document Format Files
IEEE, Jan. … http://soc.yonsei.ac.kr/test/papers/7th/[E-3].pdf * pdf. DRAM Errors in the Wild: A Large-Scale Field Study. by B Schroeder – 2009 – Cited by 9 http://www ...
http://magicopedia.com/books/ieee-papers-for-embedded-dram.html
ieee 572 | Free Manual Document Format Files
IEEE Proc. of ITC, 1993, pp. … http://soc.yonsei.ac.kr/Abstract/Korean_journal/pdf/No9_Built-In Self Test for High Density SRAMs Using Parallel Test Methodology.PDF
http://magiclopedia.net/books/ieee-572.html
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