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crf.coe.drexel.edu

Drexel University Core Facilities - Philadelphia, PA > Become a User > Competitions

http://crf.coe.drexel.edu/Become-a-User/Competitions

CRF FOM Login System. Equipment Scheduling Login (Depreciated). CRF Access Login (Depreciated). Image, Poster and Paper Competitions. The Centralized Research Facility is announcing the Third Annual Competition for images, posters and scientific papers between all researchers using CRF instruments. Submission deadline is 5 pm, May 20, 2011. Images obtained on CRF SEMs, FIB tool, TEM, optical microscopes, as well as OIM diffraction patterns and EDS element maps. Images may be black and white or colorized.

crf.coe.drexel.edu

Drexel University Core Facilities - Philadelphia, PA > Instruments

http://crf.coe.drexel.edu/Instruments/Small-Wide-Angle-X-Ray-Scattering-(SAXS-WAXS)

CRF FOM Login System. Equipment Scheduling Login (Depreciated). CRF Access Login (Depreciated). Instruments Available through the Core Facilities. X-Ray Photoelectron Spectroscopy (XPS) with Auger . XPS and AES Spectrometer (Physical Electronics VersaProbe 5000). Femtosecond Visible Transient Absorption Spectrometer (Ultrafast Systems Helios). Scanning Electron Microscope (Zeiss Supra 50VP) with EDS (Oxford). Environmental Scanning Electron Microscope (FEI XL30) with EDS (EDAX) and EBSD (TSL).

crf.coe.drexel.edu

Drexel University Core Facilities - Philadelphia, PA > Instruments > Equipment Status

http://crf.coe.drexel.edu/Instruments/Equipment-Status

CRF FOM Login System. Equipment Scheduling Login (Depreciated). CRF Access Login (Depreciated). Dual Beam FIB FEI. Small Angle X-Ray Scattering (SAXS).

crf.coe.drexel.edu

Drexel University Core Facilities - Philadelphia, PA > Instruments > Ultrafast Spectroscopy

http://crf.coe.drexel.edu/Instruments/Ultrafast-Spectroscopy

CRF FOM Login System. Equipment Scheduling Login (Depreciated). CRF Access Login (Depreciated). Femtosecond Visible Transient Absorption Spectrometer (Ultrafast Systems Helios). Contact: Jason Baxter (. Non-destructive ultrafast pump-probe measurements of liquid and solid samples. Time resolution better than 50 femtoseconds. Pump-probe delay times up to 3 nanoseconds. Probe 450 800 nm using sapphire white light continuum. Probe 350 600 nm using CaF. Spot size 500 microns. Contact: Jason Baxter (. Pulsed ...

crf.coe.drexel.edu

Drexel University Core Facilities - Philadelphia, PA > Instruments > X-Ray Diffraction

http://crf.coe.drexel.edu/Instruments/X-Ray-Diffraction

CRF FOM Login System. Equipment Scheduling Login (Depreciated). CRF Access Login (Depreciated). X-Ray Diffractometer (Rigaku SmartLab). 160;       General Description. Designed for the structural analysis of bulk solids, powders, liquids, and thin. Can analyze all crystalline forms, such as perfect, textured, polycrystalline, and also disordered and amorphous materials. Provides a complete range of structural X-ray measurements, including. Powder X-ray diffraction for phase ID and quantitative analysis.

crf.coe.drexel.edu

Instructions for Existing Core Facilities Users

http://crf.coe.drexel.edu/Existing-Users

CRF FOM Login System. Equipment Scheduling Login (Depreciated). CRF Access Login (Depreciated). Instructions for Existing Core Facilities Users. Instructions for Core Facility users to generate Individual User Reports. Click User Reports found in the left-hand sidebar. Enter Start and End dates for your query. NOTE: The report will not include the end date but will include the start date.

crf.coe.drexel.edu

Drexel University Core Facilities - Philadelphia, PA > Instruments

http://crf.coe.drexel.edu/Instruments/X-Ray-Photoelectron-Spectroscopy-(XPS)-with-Auger

CRF FOM Login System. Equipment Scheduling Login (Depreciated). CRF Access Login (Depreciated). Instruments Available through the Core Facilities. X-Ray Photoelectron Spectroscopy (XPS) with Auger . XPS and AES Spectrometer (Physical Electronics VersaProbe 5000). Femtosecond Visible Transient Absorption Spectrometer (Ultrafast Systems Helios). Scanning Electron Microscope (Zeiss Supra 50VP) with EDS (Oxford). Environmental Scanning Electron Microscope (FEI XL30) with EDS (EDAX) and EBSD (TSL).

crf.coe.drexel.edu

Drexel University Core Facilities - Philadelphia, PA > Become a User > Core Facilities User Policies

http://crf.coe.drexel.edu/Become-a-User/Core-Facilities-User-Policies

CRF FOM Login System. Equipment Scheduling Login (Depreciated). CRF Access Login (Depreciated). Core Facilities User Policies. Negligent Use of Equipment. Accompanying Person and Visitor Policies. Safety Regulations and Forms. Core Facilities services are paid up front. Prepayment for Core Facilities subscriptions and assisted usage by External academic users and Company users must be made by checks payable to "Drexel University" or by credit card. . Negligent Use of Equipment. Any costs incurred for rep...

crf.coe.drexel.edu

Drexel University Core Facilities - Philadelphia, PA > Instruments > Focused Ion Beam

http://crf.coe.drexel.edu/Instruments/Focused-Ion-Beam

CRF FOM Login System. Equipment Scheduling Login (Depreciated). CRF Access Login (Depreciated). Dual Beam Focused Ion Beam - SEM (FEI Strata DB235). Site specific precision ion milling and metal deposition for 3D nanomachining,  materials characterization, nanopatterning and nanofabrication. High brightness gallium ion beam. Gas injection systems for platinum and insulator deposition. Secondary electron and secondary ion imaging. High-resolution in-lens secondary electron detector.

crf.coe.drexel.edu

FOM System Instructions

http://crf.coe.drexel.edu/Become-a-User/FOM-System-Instructions

CRF FOM Login System. Equipment Scheduling Login (Depreciated). CRF Access Login (Depreciated).