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Defects, Adaptive Test, Yield and Data Analysis. Fort Worth, TX. Submission Deadline: September 20, 2017. Notification of Acceptance: October 2, 2017. Camera Ready Paper (.pdf): October 16, 2017. Final Presentation Slides (.ppt): October 23, 2017. DATA-2017 will be held in conjunction with ITC 2017. THEME: Data in the Product Lifecycle. To present at the workshop, send to. A PDF version of an extended abstract or a full paper (Max 10 pages, double column, 11pt font size, IEEE proceeding format) by. Analo...

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Defects, Adaptive Test, Yield and Data Analysis. Fort Worth, TX. Submission Deadline: September 20, 2017. Notification of Acceptance: October 2, 2017. Camera Ready Paper (.pdf): October 16, 2017. Final Presentation Slides (.ppt): October 23, 2017. DATA-2017 will be held in conjunction with ITC 2017. THEME: Data in the Product Lifecycle. To present at the workshop, send to. A PDF version of an extended abstract or a full paper (Max 10 pages, double column, 11pt font size, IEEE proceeding format) by. Analo...

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1 ieee international workshop

2 smithwesley@siemens com

3 data

4 spon

5 corporate sponsors

6 platinum

7 silver

8 suggested topics

9 embedded instrumentation ijtag

10 multivariate data

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Defects, Adaptive Test, Yield and Data Analysis. Fort Worth, TX. Submission Deadline: September 20, 2017. Notification of Acceptance: October 2, 2017. Camera Ready Paper (.pdf): October 16, 2017. Final Presentation Slides (.ppt): October 23, 2017. DATA-2017 will be held in conjunction with ITC 2017. THEME: Data in the Product Lifecycle. To present at the workshop, send to. A PDF version of an extended abstract or a full paper (Max 10 pages, double column, 11pt font size, IEEE proceeding format) by. Analo...

INTERNAL PAGES

data.tttc-events.org

1

IEEE Workshop on Defect and Data Driven Testing (D3T)

http://data.tttc-events.org/data2011

IEEE International Workshop on Defect and Adaptive Test Analysis (DATA-2011). Call for Paper ( pdf. For workshop only or with ITC). September 22-23, 2011. Disneyland Hotel, Anaheim, CA Convention Center, TX. Submission Deadline : August 31, 2011. Notification of Acceptance: September 6, 2011. Camera Ready Paper: September 15, 2011. DATA-2011 will be held in conjunction with ITC 2011. Yield Learning and Analysis Using DDT. Adaptive Test Database Requirements. Data-Mining Methods for Test Data Processing.

2

Committee

http://data.tttc-events.org/index_files/Page297.htm

Defects, Adaptive Test, Yield and Data Analysis. Fort Worth, TX. PUBLICITY and WEB CHAIR. The Engineers' Daughter LLC. Rob Aitken, ARM. Nemat Bidokhti, Cisco. Sreejit Chakravarty, LSI. John Carulli, Global Foundaries. Patrick Girard, LIRMM, France. Ajay Khoche, Consultant. Mike Laisne, Qualcomm. Amit Nahar, TI. Suriyaprakash Natarajan, Intel. Jay Orbon, Consultant. John Potter, Asset-Intertech. Rajesh Raina, NXP. Claude Thibeault, ETS, Canada. Li C Wang, UCSB. Xiaoqing Wen, KIT, Japan.

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Program

http://data.tttc-events.org/index_files/Page541.htm

Defects, Adaptive Test, Yield and Data Analysis. Fort Worth, TX. Call for Paper (pdf).

4

IEEE Workshop on Defect and Data Driven Testing (D3T)

http://data.tttc-events.org/data2012

Call for Paper ( pdf. For workshop only or with ITC). November 8-9, 2012. Disneyland Hotel, Anaheim, CA. IEEE International Workshop on Defect and Adaptive Test Analysis (DATA-2012). Register by Oct. 5 to get the discounted registration rates. Notification of Acceptance: September 15, 2012. Camera Ready Paper: October 15, 2012. Final Presentation Slides: November 2, 2012. DATA-2012 will be held in conjunction with ITC 2012. Data-Mining Methods for Test Data Processing. Yield Learning and Analysis. A PDF ...

5

IEEE Workshop on Defects, Adaptive Test and Data Analysis

http://data.tttc-events.org/data2014

Call for Paper (pdf). IEEE International Workshop on Defects, Adaptive Test and Data Analysis (DATA-2014). October 23-24, 2014. Washington State Convention Center, Seattle, Washington, USA. Submission Deadline: September 15, 2014. Notification of Acceptance: October 1, 201. Camera Ready Paper (.pdf): October 10, 2014. Final Presentation Slides (. ppt. October 15, 2014. DATA-2014 will be held in conjunction with ITC 2014. THEME: “BIG DATA” TECHNIQUES. Preference will be given to real-world case studies.

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Defects, Adaptive Test, Yield and Data Analysis. Fort Worth, TX. Submission Deadline: September 20, 2017. Notification of Acceptance: October 2, 2017. Camera Ready Paper (.pdf): October 16, 2017. Final Presentation Slides (.ppt): October 23, 2017. DATA-2017 will be held in conjunction with ITC 2017. THEME: Data in the Product Lifecycle. To present at the workshop, send to. A PDF version of an extended abstract or a full paper (Max 10 pages, double column, 11pt font size, IEEE proceeding format) by. Analo...

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