biometrics.uniss.it
Biometrics 2014 - Lecturers
http://biometrics.uniss.it/lecturers.php
Application for Scholarships 2016. Student presentations 2015 - PDF. Course Schedule 2016 - PDF. Course Schedule 2015 - PDF. Course Schedule 2014 - PDF. The school lecturers are all well known researchers and scientists in different areas of biometric systems, both from academia and industry. The reputation of the lecturers will assure the highest standard for the school lectures. University of Sassari, Italy. Feature extraction techniques in biometric systems. Professor of Signal Analysis. Center for Mi...
rlpvlsi.ece.virginia.edu
ARCHIVE | Robust Low Power VLSI
http://rlpvlsi.ece.virginia.edu/category/projects/archive
Skip to Main Content Area. Improving Reliability and Energy Requirements of Memory in Body Sensor Networks. A 13μW, 5pJ/cycle sub-threshold MSP430 processor in 90nm xLP FDSOI for energy-efficient IoT applications. Optimizing SRAM Bitcell Reliability and Energy for IoT Applications. Exploring Circuit Robustness to Power Supply Variation in Low-Voltage Latch and Register-Based Digital Systems. A 645 μW Self-Powered IoT SoC with Integrated Energy-Harvesting Power Management and ULP Asymmetric Radios. Techno...
rlpvlsi.ece.virginia.edu
Robust Low Power VLSI
http://rlpvlsi.ece.virginia.edu/newhome
Skip to Main Content Area. Ultra low power (ULP) miniature devices are enabling a new generation of applications for areas such as healthcare and wireless environmental control. Reconfigurable circuits, designed for low-power operation, promise to make ubiquitous implementation of these systems possible by providing a combination of adequate computing capability. The Advanced Self-Powered Systems of Integrated Sensors and Technologies ( ASSIST. Center is a new NSF. Panoptic Dynamic Voltage Scaling (PDVS).
rlpvlsi.ece.virginia.edu
High Reliability SRAM for Extreme Environmental Conditions | Robust Low Power VLSI
http://rlpvlsi.ece.virginia.edu/content/high-reliability-sram-extreme-environmental-conditions
Skip to Main Content Area. Improving Reliability and Energy Requirements of Memory in Body Sensor Networks. A 13μW, 5pJ/cycle sub-threshold MSP430 processor in 90nm xLP FDSOI for energy-efficient IoT applications. Optimizing SRAM Bitcell Reliability and Energy for IoT Applications. Exploring Circuit Robustness to Power Supply Variation in Low-Voltage Latch and Register-Based Digital Systems. A 645 μW Self-Powered IoT SoC with Integrated Energy-Harvesting Power Management and ULP Asymmetric Radios.
rlpvlsi.ece.virginia.edu
New UltraThin SRAM Layout | Robust Low Power VLSI
http://rlpvlsi.ece.virginia.edu/node/317
Skip to Main Content Area. Improving Reliability and Energy Requirements of Memory in Body Sensor Networks. A 13μW, 5pJ/cycle sub-threshold MSP430 processor in 90nm xLP FDSOI for energy-efficient IoT applications. Optimizing SRAM Bitcell Reliability and Energy for IoT Applications. Exploring Circuit Robustness to Power Supply Variation in Low-Voltage Latch and Register-Based Digital Systems. A 645 μW Self-Powered IoT SoC with Integrated Energy-Harvesting Power Management and ULP Asymmetric Radios. Depart...
rlpvlsi.ece.virginia.edu
Body Sensor Networks | Robust Low Power VLSI
http://rlpvlsi.ece.virginia.edu/category/projects/body-sensor-networks
Skip to Main Content Area. A 13μW, 5pJ/cycle sub-threshold MSP430 processor in 90nm xLP FDSOI for energy-efficient IoT applications. Optimizing SRAM Bitcell Reliability and Energy for IoT Applications. Exploring Circuit Robustness to Power Supply Variation in Low-Voltage Latch and Register-Based Digital Systems. Improving Reliability and Energy Requirements of Memory in Body Sensor Networks. A 645 μW Self-Powered IoT SoC with Integrated Energy-Harvesting Power Management and ULP Asymmetric Radios. In thi...
rlpvlsi.ece.virginia.edu
Awards and Honors | Robust Low Power VLSI
http://rlpvlsi.ece.virginia.edu/content/awards-and-honors
Skip to Main Content Area. Improving Reliability and Energy Requirements of Memory in Body Sensor Networks. A 13μW, 5pJ/cycle sub-threshold MSP430 processor in 90nm xLP FDSOI for energy-efficient IoT applications. Optimizing SRAM Bitcell Reliability and Energy for IoT Applications. Exploring Circuit Robustness to Power Supply Variation in Low-Voltage Latch and Register-Based Digital Systems. Combining SRAM Read/Write Assist Techniques for Near/Sub-Threshold Voltage Operation. L William Ballard Fellowship.
rlpvlsi.ece.virginia.edu
Circuit Techniques for Lowering SRAM VMIN | Robust Low Power VLSI
http://rlpvlsi.ece.virginia.edu/content/circuit-assist-methods-nanoscale-sram
Skip to Main Content Area. Improving Reliability and Energy Requirements of Memory in Body Sensor Networks. A 13μW, 5pJ/cycle sub-threshold MSP430 processor in 90nm xLP FDSOI for energy-efficient IoT applications. Optimizing SRAM Bitcell Reliability and Energy for IoT Applications. Exploring Circuit Robustness to Power Supply Variation in Low-Voltage Latch and Register-Based Digital Systems. A 130nm Canary SRAM for SRAM Dynamic Write VMIN Tracking across Voltage, Frequency, and Temperature Variations.
wirelesshealth.virginia.edu
Authors | wirelesshealth.virginia.edu
http://wirelesshealth.virginia.edu/biblio/authors
Adam T. Barth PD. Mark A. Hanson PD. Martha Anderson, DNP CS. Powell, Jr HC. Powell, Jr. HC. Powell Jr. HC. Department of Computer Science. Department of Electrical and Computer Engineering.
enews.seas.virginia.edu
ECE – Engineering News
http://enews.seas.virginia.edu/ece
UVA Mechanical & Aerospace News. UVA Computer Science News. UVA Systems and Information News. UVA Materials Science & Engineering News. UVA Chemical Engineering News. UVA Engineering & Society News. UVA Civil & Environmental Engineering News. UVA Electrical & Computer Engineering News. UVA Electrical and Computer Engineering News. UVA Engineering Professor Avik Ghosh’s Work Named Top-10 Breakthrough of Year. December 20, 2016. UVA Engineering Professor Named to National Academy of Inventors. UVA, Columbi...
SOCIAL ENGAGEMENT