ellipsometry.hu

Ellipsometry @ MTA EK MFA

Hemicylindrical plasmon-enhanced Kretschmann ellipsometry. Plasmon-enhanced two-channel, multi-angle in situ. Combination of ellipsometry with waveguide interferometry. Multiple angle of incidence, spectroscopic, plasmon-enhanced, internal reflection ellipsometry for the characterization of solid-liquid interface processes. SE vs XRF on fibrinogen monolayers. In-depth characterization and computational 3D reconstruction of flagellar filament protein layer structure based on in situ. Reconstruction of sub...

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Ellipsometry @ MTA EK MFA | ellipsometry.hu Reviews

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Hemicylindrical plasmon-enhanced Kretschmann ellipsometry. Plasmon-enhanced two-channel, multi-angle in situ. Combination of ellipsometry with waveguide interferometry. Multiple angle of incidence, spectroscopic, plasmon-enhanced, internal reflection ellipsometry for the characterization of solid-liquid interface processes. SE vs XRF on fibrinogen monolayers. In-depth characterization and computational 3D reconstruction of flagellar filament protein layer structure based on in situ. Reconstruction of sub...

<META> KEYWORDS

1 bioellipsometry

2 mapping

3 nanostructures

4 photonic structures

5 photovoltaics

6 modeling

7 optical properties

8 waveguide characterizations

9 publications

10 projects

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bioellipsometry,mapping,nanostructures,photonic structures,photovoltaics,modeling,optical properties,waveguide characterizations,publications,projects,equipment,history,cooperations,staff,p petrik,m fried,t lohner,b fodor,e agocs,j nador,b kalas,in situ

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Ellipsometry @ MTA EK MFA | ellipsometry.hu Reviews

https://ellipsometry.hu

Hemicylindrical plasmon-enhanced Kretschmann ellipsometry. Plasmon-enhanced two-channel, multi-angle in situ. Combination of ellipsometry with waveguide interferometry. Multiple angle of incidence, spectroscopic, plasmon-enhanced, internal reflection ellipsometry for the characterization of solid-liquid interface processes. SE vs XRF on fibrinogen monolayers. In-depth characterization and computational 3D reconstruction of flagellar filament protein layer structure based on in situ. Reconstruction of sub...

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petrik.ellipsometry.hu

Peter Petrik's homepage

MFA Laboratory of Ellipsometry. Enhanced protein adsorption and cellular adhesion using transparent titanate nanotube thin films made by a simple and inexpensive room temperature process: Application to optical biochips. In-depth characterization and computational 3D reconstruction of flagellar filament protein layer structure based on in situ spectroscopic ellipsometry measurements. In situ ellipsometric study of surface immobilization of flagellar filaments. Last update: May 30, 2015.

INTERNAL PAGES

ellipsometry.hu

1

Projects

http://www.ellipsometry.hu/projects.html

SEA4KET (2013-2016, FP7 project): Assessment experiments in nanoelectronics and smart systems. Project leader: Miklos Fried. E450EDL (2013-2016, FP7 project): European 450mm equipment demo line. Project leader: Miklos Fried. KMR 12 1 (2013-2014, Hungarian project): Optical mapping tool for thin films on industrial scales. Project leader: Miklos Fried. OTKA K81842 (2010-2012, Hungarian project): Protein and nanocrystalline semiconductor layers for sensors and photovoltaics. Project leader: Péter Petrik.

2

Projektek

http://www.ellipsometry.hu/projects_hu.html

SEA4KET (2013-2016, FP7 project): Assessment experiments in nanoelectronics and smart systems. Project leader: Miklos Fried. E450EDL (2013-2016, FP7 project): European 450mm equipment demo line. Project leader: Miklos Fried. KMR 12 1 (2013-2014, Hungarian project): Ipari méretű vékonyréteg bevonatok optikai térképezésére szolgáló berendezés fejlesztése. Project leader: Miklos Fried. DAAD-MÖB (2008-2009, magyar-német kutatócsere program a magyar és német állam finanszírozásában): Optikai modellek fejleszt...

3

Equipment

http://www.ellipsometry.hu/equipment.html

Rotating compensator spectroscopic ellipsometer in the wavelenth range of 190-1700 nm with an automatic goniometer and and automatic sample stage. Focusing works down to 0.15 mm. The measurement time is a couple of seconds per spot. Divergent light-source mapping ellipsometer. We are continuously developing equipment for large area mapping applications. For some most recent results see M. Fried, "On-line monitoring of solar cell module production by ellipsometry technique", TSF 2014.

4

Publikaciok

http://www.ellipsometry.hu/publications_hu.html

P Petrik, N. Kumar, M. Fried, B. Fodor, G. Juhasz, S. F: Pereira, S. Burger, H. P. Urbach, "Fourier ellipsometry - An ellipsometric approach to Fourier scatterometry", Journal of the European Optical Society - Rapid Publications 10 (2015) 15002. E Szilagyi, I. Banyasz, E. Kotai, A. Nemeth, C. Major, M. Fried, G. Battistig, "Determination of migration of ion-implanted Ar and Zn in silica by backscattering spectrometry", Radiation Effects and Defects in Solids 170 (2015). N Kumar, P. Petrik, G. K&#...T Loh...

5

Publications

http://www.ellipsometry.hu/publications.html

P Petrik, N. Kumar, M. Fried, B. Fodor, G. Juhasz, S. F: Pereira, S. Burger, H. P. Urbach, "Fourier ellipsometry - An ellipsometric approach to Fourier scatterometry", Journal of the European Optical Society - Rapid Publications 10 (2015) 15002. E Szilagyi, I. Banyasz, E. Kotai, A. Nemeth, C. Major, M. Fried, G. Battistig, "Determination of migration of ion-implanted Ar and Zn in silica by backscattering spectrometry", Radiation Effects and Defects in Solids 170 (2015). N Kumar, P. Petrik, G. K&#...T Loh...

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Ellipsometry @ MTA EK MFA

Hemicylindrical plasmon-enhanced Kretschmann ellipsometry. Plasmon-enhanced two-channel, multi-angle in situ. Combination of ellipsometry with waveguide interferometry. Multiple angle of incidence, spectroscopic, plasmon-enhanced, internal reflection ellipsometry for the characterization of solid-liquid interface processes. SE vs XRF on fibrinogen monolayers. In-depth characterization and computational 3D reconstruction of flagellar filament protein layer structure based on in situ. Reconstruction of sub...

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