ceriumlabs.com
Cerium Newsletters
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Small Business Innovation Research (SBIR). Materials Analyses - Solar cell, Fuel cell components and starting materials. TEM applications - Metrology and Materials characterization. Chemical Analyses - Organic and Inorganic Contamination analysis. Surface Science - Film Thickness measurements by X-ray Reflection. April 2011 Newsletter - Featuring Rutherford Backscattering Spectroscopy. June 2010 Newsletter - Differentiation between graphitic carbon structures utilizing Raman Spectroscopy.
ceriumlabs.com
Analytical service laboratory with ISO 17025 accreditation
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Small Business Innovation Research (SBIR). Materials Analyses - Solar cell, Fuel cell components and starting materials. TEM applications - Metrology and Materials characterization. Chemical Analyses - Organic and Inorganic Contamination analysis. Surface Science - Film Thickness measurements by X-ray Reflection. By Envision Creative Group.
ceriumlabs.com
Analytical services laboratory offering physical and chemical characterization of materials for devices
http://www.ceriumlabs.com/5/Our_Services.htm
Small Business Innovation Research (SBIR). Materials Analyses - Solar cell, Fuel cell components and starting materials. TEM applications - Metrology and Materials characterization. Chemical Analyses - Organic and Inorganic Contamination analysis. Surface Science - Film Thickness measurements by X-ray Reflection. Cerium Labs offers a variety of services. These include:. Preparation is dependent upon the sample type and the objective of the analysis. Cerium has many sample preparation capabilities inc...
ceriumlabs.com
Analytical Laboratory Services for semicondutor solar cell and fuel cell manufacturers
http://www.ceriumlabs.com/44/Industries_Served.htm
Small Business Innovation Research (SBIR). Small Business Innovation Research (SBIR). Materials Analyses - Solar cell, Fuel cell components and starting materials. TEM applications - Metrology and Materials characterization. Chemical Analyses - Organic and Inorganic Contamination analysis. Surface Science - Film Thickness measurements by X-ray Reflection. By Envision Creative Group.
ceriumlabs.com
Reverse Engineering for IC redesign and patent infringement
http://www.ceriumlabs.com/98/Reverse_Engineering.htm
Small Business Innovation Research (SBIR). Materials Analyses - Solar cell, Fuel cell components and starting materials. TEM applications - Metrology and Materials characterization. Chemical Analyses - Organic and Inorganic Contamination analysis. Surface Science - Film Thickness measurements by X-ray Reflection. Sample Teardown Report - Motorola W178G. By Envision Creative Group.
ceriumlabs.com
High resolution electron imaging and analytical analysis of materials
http://www.ceriumlabs.com/10/Analytical_Imaging.htm
Small Business Innovation Research (SBIR). Materials Analyses - Solar cell, Fuel cell components and starting materials. TEM applications - Metrology and Materials characterization. Chemical Analyses - Organic and Inorganic Contamination analysis. Surface Science - Film Thickness measurements by X-ray Reflection. Field Emission Scanning Electron Microscopy. Scanning electron imaging to view samples at magnifications up to 500,000 times. Metrology, construction analysis, defect analysis. Up to 200 mm wafer.
ceriumlabs.com
Surface Science techniques for elemental analysis of materials
http://www.ceriumlabs.com/12/Surface_Science.htm
Small Business Innovation Research (SBIR). Materials Analyses - Solar cell, Fuel cell components and starting materials. TEM applications - Metrology and Materials characterization. Chemical Analyses - Organic and Inorganic Contamination analysis. Surface Science - Film Thickness measurements by X-ray Reflection. Secondary Ion Mass Spectroscopy. Mass analysis surface and depth profiling. Dopant or compositional element depth analysis. Down to 1e12 at/cm. 100 μm X 100 μm raster. Down to 1E16 at/cm. Trace ...
ceriumlabs.com
Litigation Support for patent investigations or product failures
http://www.ceriumlabs.com/96/Semiconductor_IP_Litigation_Support.htm
Small Business Innovation Research (SBIR). Materials Analyses - Solar cell, Fuel cell components and starting materials. TEM applications - Metrology and Materials characterization. Chemical Analyses - Organic and Inorganic Contamination analysis. Surface Science - Film Thickness measurements by X-ray Reflection. Our litigation services include:. Physical analysis of product failures. Supporting evidence data collection and interpretation. Full confidentiality and chain of custody.
ceriumlabs.com
Analytical chemistry techniques for trace contaminants analysis
http://www.ceriumlabs.com/13/Analytical_Chemistry.htm
Small Business Innovation Research (SBIR). Materials Analyses - Solar cell, Fuel cell components and starting materials. TEM applications - Metrology and Materials characterization. Chemical Analyses - Organic and Inorganic Contamination analysis. Surface Science - Film Thickness measurements by X-ray Reflection. Glow Discharge Mass Spectrometry. Glow Discharge Mass Spectrometry. Identify and measure a wide range of elements from ppt up to matrix level concentrations. Solid samples and films. Inductively...
ceriumlabs.com
http://www.ceriumlabs.com/58/Publications.htm
Small Business Innovation Research (SBIR). Materials Analyses - Solar cell, Fuel cell components and starting materials. TEM applications - Metrology and Materials characterization. Chemical Analyses - Organic and Inorganic Contamination analysis. Surface Science - Film Thickness measurements by X-ray Reflection. Journal and Conference Publications. Microscopy and Microanalysis 2010 Conference. SEM Imaging of Resist Patterns Fabricated Through Imprint Lithography Techniques (abstract). CT Schamp, B.T...
