sims.gfz-potsdam.de

SIMS: Secondary ion mass spectrometry (SIMS)

Secondary ion mass spectrometry (SIMS). The Potsdam Ion Microprobe (SIMS) User Facility. Backscattered electron image of a zircon crystal with a 20µm diameter sputter crater produced during a 90 minute SIMS analysis. Ion microprobes offer six modes of operation for geoscience applications:. Isotopic Analyses: Our 1280-HR instrument provides an analytical repeatability down to below 0.2 (1sd) for many major elements in a variety of crystalline matrices. Depth Profiling: Depth resolution on the Cameca 1280...

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SIMS: Secondary ion mass spectrometry (SIMS) | sims.gfz-potsdam.de Reviews

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Secondary ion mass spectrometry (SIMS). The Potsdam Ion Microprobe (SIMS) User Facility. Backscattered electron image of a zircon crystal with a 20µm diameter sputter crater produced during a 90 minute SIMS analysis. Ion microprobes offer six modes of operation for geoscience applications:. Isotopic Analyses: Our 1280-HR instrument provides an analytical repeatability down to below 0.2 (1sd) for many major elements in a variety of crystalline matrices. Depth Profiling: Depth resolution on the Cameca 1280...

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SIMS: Secondary ion mass spectrometry (SIMS) | sims.gfz-potsdam.de Reviews

https://sims.gfz-potsdam.de

Secondary ion mass spectrometry (SIMS). The Potsdam Ion Microprobe (SIMS) User Facility. Backscattered electron image of a zircon crystal with a 20µm diameter sputter crater produced during a 90 minute SIMS analysis. Ion microprobes offer six modes of operation for geoscience applications:. Isotopic Analyses: Our 1280-HR instrument provides an analytical repeatability down to below 0.2 (1sd) for many major elements in a variety of crystalline matrices. Depth Profiling: Depth resolution on the Cameca 1280...

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sims.gfz-potsdam.de

1

SIMS: Routine Analyses of the Potsdam SIMS Lab

http://sims.gfz-potsdam.de/routine-analyses

Secondary ion mass spectrometry (SIMS). Between now and 2016 the Potsdam SIMS lab will develop roughly a half-dozen routine applications that will function in an automated point-and-analyze mode. As these methods become established and the required reference materials are developed the new analytical capabilities will be listed here. Analytical parameters are approximate and are meant only as a general guide. Beam Diameter: between 5 µm (for high B contents) and 15 µm at µg/g boron levels.

2

SIMS: Travel Info

http://sims.gfz-potsdam.de/travel

Secondary ion mass spectrometry (SIMS). Berlin has two airports: Tegel (TXL) and Schönefeld (SFX). Both of these have good public tranasport connections to Potsdam, so people traveling to Potsdam should choose the airport most conveient in terms of flight timings and connections. The following gives you step-by-step instructions on getting from the airport to Potsdam's main railway station (Potsdam Hauptbahnhof). From Tegel Airport to Potsdam Hbf (Potsdam Main Station):. Find the platform for the next RB...

3

SIMS: Publications

http://sims.gfz-potsdam.de/publications

Secondary ion mass spectrometry (SIMS). Publications from the 1280-HR Lab. Li, Y, Huang, R.F., Wiedenbeck, M., Keppler, H. (2015) Nitrogen distribution between aqueous fluids and silicate melts. Earth and Planetray Science Letters, 411, 218-228. Conference Abstracts from Cameca 1280-HR. Download Poster 10.4 MB. Farber, K., Dziggel, A., Meyer, F.M., Trumbull, R.B., Wiedenbeck, M. (2014) B-isotope study of hydrothermal tourmaline in silicified komatiites from the Barberton Green...Download Talk 2.5 MB.

4

SIMS: Staff

http://sims.gfz-potsdam.de/staff

Secondary ion mass spectrometry (SIMS). Current Members of our Laboratory Staff. Office Room Number: D123. Office Room Number: B151. Focus: Sample Embedding and Polishing. Sample Prep Method Development. Graudate Student (University of the Witwatersrand). Office Room Number: B124. Graduate Student (Nelson Mandela Metropolitan University). Office Room Number: B124. Focus: Carbon Isotope Ratios. Alexander.rocholl(at)gfz.potsdam.de. Office Room Number: B121. Focus: Routine Applications Support.

5

SIMS: Short Course

http://sims.gfz-potsdam.de/short-course

Secondary ion mass spectrometry (SIMS). Introduction to Secondary Ion Mass Spectrometry in the Earth Sciences. 07 to 11 November 2016. Optional visits to other Helmholtz SIMS facilities in Dresden (Super SIMS) and Leipzig (NanoSIMS and ToF-SIMS). 13 to 15 November 2016. The 2016 SIMS short course will again be under the auspices of both the International Association of Geoanalysts. And the Deutsche Mineralogische Gesellschaft. Putting SIMS Short course in the subject heading. 13:30 - 16:30 Visits to GFZ ...

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SIMS: Secondary ion mass spectrometry (SIMS)

Secondary ion mass spectrometry (SIMS). The Potsdam Ion Microprobe (SIMS) User Facility. Backscattered electron image of a zircon crystal with a 20µm diameter sputter crater produced during a 90 minute SIMS analysis. Ion microprobes offer six modes of operation for geoscience applications:. Isotopic Analyses: Our 1280-HR instrument provides an analytical repeatability down to below 0.2 (1sd) for many major elements in a variety of crystalline matrices. Depth Profiling: Depth resolution on the Cameca 1280...

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Hlavní stránka - SIMS v2.0

Bull; ÚVT MU. Upozornění na migraci SIMS. Webová aplikace SIMS byla přesunuta na doménu Ministerstva školství, mládeže a tělovýchovy (msmt.cz). Upozornění na migraci aplikace SIMS. 18 května 2015 byla webová aplikace SIMS přesunuta na doménu Ministerstva školství, mládeže a tělovýchovy. Pokračujte, prosím, na sims.msmt.cz. Opravte si, prosím, původní odkazy vedoucí na SIMS z Vašich systémů a webových stránek. Vše ostatní zůstává zachováno. Bull; Stránka byla načtena 14. srpna 2015 v 2.23:24.