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Parent of Powerful Brands in the Electronics Industry

Parent company of four powerful brands in the semiconductor and electronics industry: LTX-Credence, atg Luther & Maelzer, ECT und Multitest.

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Parent of Powerful Brands in the Electronics Industry | xcerra.com Reviews
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Parent company of four powerful brands in the semiconductor and electronics industry: LTX-Credence, atg Luther & Maelzer, ECT und Multitest.
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Parent of Powerful Brands in the Electronics Industry | xcerra.com Reviews

https://xcerra.com

Parent company of four powerful brands in the semiconductor and electronics industry: LTX-Credence, atg Luther & Maelzer, ECT und Multitest.

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blog.xcerra.com blog.xcerra.com

Welcome to the Xcerra Blog - Xcerra Blog

5G: Plunging into open-ended test requirements. Mobile broadband technology is beginning to crawl from commonly known 4th Generation Wireless (4G) transmission standards to fifth generation wireless IMT2020 standardization, also known as 5G. This 5G network technology will influence semiconductor test in two directions, an evolutionary track and a revolutionary paradigm shift. September 21, 2016. Is a final test solution for WLCSP devices needed? June 22, 2016. May 3, 2016. April 19, 2016. Today, everybo...

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Jobs – xcerra

Technical Sales Interface Products (M/F). Elektroniker in Teilzeit (m/w). Set Up A, CNC Machinist (m/w). RF Applications Engineer (m/w). Atg Luther and Maelzer.

INTERNAL PAGES

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1

Turnkey Solutions from the Only Global Provider

http://xcerra.com/pcba

David G. Tacelli President and CEO. Mark J. Gallenberger Senior Vice President, Chief Operating Officer, Chief Financial Officer. Pascal Rondé Senior Vice President, Global Customer Team. Atg Luther & Maelzer. News & Events. IEEE European Test Symposium. GSA European Executive Forum. Contact & Support. Events & Presentations. Turnkey solutions from the only global provider. Globally positioned engineering and manufacturing sites. Setting standards for board level manufacturing test. Tilt for low cost ICT.

2

Expanding the Limits of Test

http://xcerra.com/probes

David G. Tacelli President and CEO. Mark J. Gallenberger Senior Vice President, Chief Operating Officer, Chief Financial Officer. Pascal Rondé Senior Vice President, Global Customer Team. Atg Luther & Maelzer. News & Events. IEEE European Test Symposium. GSA European Executive Forum. Contact & Support. Events & Presentations. Expanding the limits of test. For in-circuit test and functional test, OEM and industrial. Higher quality, longer life, and better performance. ICT / FCT probe. The ICT/FCT product ...

3

Experienced Leadership - Board of Directors

http://xcerra.com/board_directors

David G. Tacelli President and CEO. Mark J. Gallenberger Senior Vice President, Chief Operating Officer, Chief Financial Officer. Pascal Rondé Senior Vice President, Global Customer Team. Atg Luther & Maelzer. News & Events. IEEE European Test Symposium. GSA European Executive Forum. Contact & Support. Events & Presentations. Experienced Leadership – Board of Directors. Roger W. Blethen. David G. Tacelli. Mark S. Ain. Roger J. Maggs. Bruce R. Wright. David G. Tacelli – President and CEO.

4

ATE for Semiconductor Test

http://xcerra.com/ate

David G. Tacelli President and CEO. Mark J. Gallenberger Senior Vice President, Chief Operating Officer, Chief Financial Officer. Pascal Rondé Senior Vice President, Global Customer Team. Atg Luther & Maelzer. News & Events. IEEE European Test Symposium. GSA European Executive Forum. Contact & Support. Events & Presentations. ATE for Semiconductor Test. Digital dominant applications such as ASSP and MCU devices. Complex mixed signal (analog and digital) and RF semiconductor devices. Of testers are target...

5

Xcerra - Mission

http://xcerra.com/mission

David G. Tacelli President and CEO. Mark J. Gallenberger Senior Vice President, Chief Operating Officer, Chief Financial Officer. Pascal Rondé Senior Vice President, Global Customer Team. Atg Luther & Maelzer. News & Events. IEEE European Test Symposium. GSA European Executive Forum. Contact & Support. Events & Presentations. You can count on us to:. Develop market leading products for the markets we service. Offer solutions that optimize the overall test cell and shorten time to high-volume production.

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Sponsors - TestVision 2020

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Become an Test Vision Sponsor! TestVision is now in its 9th year and is a two-time winner of the "Most Successful Event" Award of the IEEE Test Technology Technical Council. Last year's event attracted over 100 attendees who are the drivers of test strategy in their respective companies. Sponsorship gets a company's name in front of a highly targeted audience both at the conference and in emails and web pages advertising the event. We offer various sponsorship options:. Company name on Workshop gift.

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All Archives - Xcerra Blog

http://blog.xcerra.com/category/all

Sensor Technologies Will Be Increasingly Important in the Future. March 9, 2017. Semiconductor giant AMS has set some aggressive growth plans for the coming years. Achieving them will rely on a workforce with a will to win and out-of-the-box thinking. Read the full article in the CEO Magazine here: http:/ www.theceomagazine.com/business/alexander-everke/. Http:/ blog.xcerra.com/wp-content/uploads/2017/03/Health-Care-iStock 000012067057 Medium.jpg. Choosing the Right Spring Probe for ICT and FCT Testing.

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RF requirements and spring probe development for semiconductor test

http://blog.xcerra.com/rf-requirements-spring-probe-development-semiconductor-test

RF requirements and spring probe development for semiconductor test. July 1, 2015. This article will begin by exploring present and future RF device requirements’ linking several RF device applications with their critical high speed electrical test requirements. Read the full article here. Http:/ blog.xcerra.com/wp-content/uploads/2016/02/GSG-configuration-ZIP0.jpg. Http:/ blog.xcerra.com/wp-content/uploads/2015/08/logo-xcerra1.png. RF requirements and spring probe development for semiconductor test.

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IoT: Smart Things Need Flexible Test

http://blog.xcerra.com/smart-things-need-flexible-test

Smart Things Need Flexible Test. November 30, 2015. Download the full article here. Http:/ blog.xcerra.com/wp-content/uploads/2015/06/Internet-of-Things iStock Medium-1030x1030.jpg. Http:/ blog.xcerra.com/wp-content/uploads/2015/08/logo-xcerra1.png. Smart Things Need Flexible Test. You might also like. RF Engineering, Circuit and Systems Theory - Part 9. RF Engineering, Circuit and Systems Theory - Part 10. Using Chirps in Production Test. RF Engineering, Circuit and Systems Theory - Part 3.

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3D Archives - Xcerra Blog

http://blog.xcerra.com/tag/3d

So what is 3D and TSV and how does it impact semiconductor test? January 10, 2012. To those who are not familiar, here is a very brief description of what 3D is:. One State of the Art device; the Elpida Wide IO Mobile RAM shown next to a PoP just announced on 15 November 2011 processed in 30 nm CMOS is shown here. Notice the density and performance improvement 3D brings to the party. Graphic compliments of www.Elpida.com. This all begs the question, but what will it cost? What will the yield be? There is...

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Powerful Brands in the Semiconductor and Electronics

http://ect-fsg.com/xcerra

Markets & Solutions. ICT Fixture Actuation Methods. Dual Access Vac Box. Fixture Add On s. Test Fixture Maintenance Guideline. FCT Fixture Actuation Methods. Cable & Harness Assy. Design for Testability Reports. Header Presence / Orientation. Bareboard & Backplane Fixtures. TTI & Testronics. Zeus & Hybrid Zeus. Fixture and Kit Parts. FEA / Board Stress Analysis. Board Stress Analysis (BSA). Design for Test Spec. Gerber to CAD Translation. News & Events. Typical Process & Application. Xcerra Corporation w...

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ATE News

http://www.ateforum.com/news/index.php/the-news

Specialists in Materials Characterization. Innovative Solutions to Maximize Yield. Silicon Valley Test Workshop. The only Workshop on Semiconductor Testing in Silicon Valley. Signal Integrity for Test and Product Engineers. Another year, another SEMICON West. Created on Wednesday, 16 July 2014 05:58. The ATE excitement was not on the exhibit floor at this year's SEMICON West. But in the program related events. Perhaps SEMICON West is showing its age? Next year it turns 45. Of the major ATE companies,.

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Parent of Powerful Brands in the Electronics Industry

David G. Tacelli – President and CEO. Mark J. Gallenberger – Senior Vice President, Chief Operating Officer, Chief Financial Officer. Pascal Rondé – Senior Vice President, Global Customer Team. Atg Luther & Maelzer. News & Events. BiTS – ECT. BiTS – Xcerra. GSA European Executive Forum. Contact & Support. Events & Presentations. Enabling Test for High Voltage Applications. Reliable Probes for Most Challenging High Current Testing. Lowering Cost of Test by Reuse of Test Interfaces. Contact & Support.

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